Surface Analysis (SEM-SE, SEM-BSE and SEM-EDS) on E(IM1)-Enhanced Sapphires
Fig. 14 SEM-SE image of sapphire showing craters due to surface melting of the sapphire material (See arrow). Acceleration voltage 30kV.
Fig. 15 SEM-BSE image of enlarged area of Fig. 14. The crack is shown as well as a melting crater in the sapphire (arrow) in course of the new E(IM1)-enhancement. Acceleration voltage 30kV.
Fig. 16 SEM-SE image of the matrix between sapphires. Note: Presence of more heavy elements is seen as a white color. These heavy elements are mostly composed of Zirconium (Zr)-oxide of unknown crystal structure (Aluminium (Al) from corundum contamination) as shown by SEM-EDS spectrum on right (Acceleration Voltage=20kV). Note also: Presence of fuorine (F). Samples carbon (C) coated.
Fig. 17 SEM-SE enlarged portion of the crack shows the growth of dendrites of Zirconium (Zr)-oxide and SEM-EDS spectrum of the same area (Aluminium (Al) from corundum). No high concentrations of iron (Fe), titanium (Ti) or chromium (Cr) were detected as shown by SEM-EDS spectrum on right (Acceleration Voltage=30kV).
