Scanning Electron Microscope Analysis (SEM) of the Substances Formed By the New E (IM1)-Heat Treatment on the Surface of Natural Sapphires, December 2001, Chantaburi, Thailand
Fig. 18 SEM-SE image of several crystallites of different crystal shapes were detected, mostly composed of Zirconium (Zr)-oxide and Silizium (Si)-oxide phases as shown by the SEM-EDS spectrum. Aluminum (Al) from Corundum. Sample carbon (C) coated. Acceleration voltage 15kV.
Fig. 19 SEM-SE image of crystallites composed of Zirconium (Zr)-oxide. This crystallite must have been formed over the course of the heating experiments. SEM-EDS spectrum on right (Acceleration voltage 15kV). Sample carbon (C) coated.
Table 3b Comparison of LA-ICP-MS Data and ED-XRF (in oxide-wt.-%). Values given for ED-XRF represent bulk analysis, whereas LA-ICP-MS data is multiple local analysis (Averaged). Therefore, variation of concentrations are sample dependant. ND = Below detection limit or not detectable. CaO- and K2O-concentrations are due to surface contaminations. Repeated measurements include repositioning of the sample.
