|
was corrected by measuring the reference material four times - twice at the beginning, and twice at the end of an analytical run using a linear interpolation of the sensitivity with time. For this study more than 30 samples were analyzed - with mainly Be, Mg, Al, Cr, Mn, Ti, and some 30 other trace elements, measured in all samples.
|
The detection limits for the following elements are:
Be = 0.3 to 0.5ppm
Mg = 0.2 to 0.5ppm
Ti = 1ppm
Cr = 2ppm
V = 0.1 - 0.2ppm
Fe = 3ppm
Ga = 0.06 to 0.12ppm
(variation depending on the concentrations measured)
|
In most samples, a profile across the mineral was probed using an 80 micron crater diameter to determine the edge rim concentration. Blank level determinations were placed randomly across the sample to determine differences between enhanced (E), unheated (N) and samples enhanced with the new E(IM)-method.
|
|
Fig. 38 Detailed image of the microscope, sample chamber (above) and Mass-spectrometer (below) used for LA-ICP-MS analysis. Applications - See: Guillong M. and Günther, D.(2001): ‘Quasi “non-destructive” Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry Fingerprinting of Sapphires. Spectrochemia Acta Part B, 56, p 1219-1231.
|
