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Fig. 40 . Microphotograph of a princess cut white sapphire enhanced by the new E(IM1)-method (second half shown on right). The sample was cut in half after treatment and probed by LA-ICP MS in a profile across the sample. Craters indicate Laser sampling sites.
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Fig. 41. Chemical compositions in a profile across the white sapphire enhanced with the new E(IM1)-method as determined by LA-ICP-MS. Note chemical compositions are dominated by trace element Fe only, while light elements, such as Be and Mg, are subordinate. The Beryllium concentrations are restricted to the outer zone and do not exceed 15ppm. Note: Decrease of trace elements including Fe and Mg concentrations towards the rim and the increase towards the center of the faceted gemstone, a trend which is confined to the surface of the faceted gemstone and produced by the new E(IM1) enhancement. Ti-concentrations are higher than Mg-concentrations.
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Fig 42: LA-ICP-MS analysis in a profile across the sample (in ppm). It is shown that the Beryllium concentrations are restricted to the outer rim outside the observed color zonings. The maximum concentrations are below 15ppm. It is evident that Be-enrichments occurred outside the zones enriched by Mg.
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