Analysis of Non-Sapphire Materials by Scanning Electron Microscopy (SEM)

Fig. 9. Dr. A. Peretti mounts the Chrysoberyl samples for SEM-EDS analysis in February 2002 at the University of Basel, Switzerland). Fig. 10 SEM-SE image of a faceted Chrysoberyl crystal after heat treatment. The crystal has a thin film overgrowth with interference color. Sample not carbon-coated for analysis. Acceleration voltage 20kV Fig. 11 Microphotograph of glass-aggregate formed by the melting of non-sapphire materials during the new E(IM1)-treatment. Fig. 12 SEM-SE image of different colored sapphires clustered together in accidental circumstances during the new E(IM1)-heat treatment experiments. Acceleration voltage 15kV.

Fig. 13 SEM-BSE image of an inclusion in a fancy sapphire unenhanced by heat (Songea, Tanzania) as determined in 1996 at the SEM laboratory at the University of Basel’s Geological Institute. The SEM-EDS spectrum of the white phase in the picture is shown on left (Fe-Ti-oxide, Carbon (C) from coating). The inclusion is composed of an intergrowth of Titanium (Ti)-oxide and Iron (Fe)-Titanium (Ti)-oxide mineral inclusions, approx. 10 micrometers in size.

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