Details Method LA-ICP-MS

Explanation of method The laser ablation technique (LA) uses a 193 nm excimer laser (1) which is focused onto the sample surface via microscope lenses (2). The laser is ablating (carrying away) the material (crater diameter 4 to 80 microns) (3). The mobilized material is suspended in a carrier gas (4) and transported via transport tube into an Inductively Coupled Plasma Mass Spectrometer (ICP-MS) (5). The material/elements (except those that cannot be ionized, such as gases and fluorine) are vaporized, atomized and ionized within the ICP . The created ions are then transferred to the mass spectrometer and separated by their mass divided by charge (5). The detector allows measuring major, minor and trace elements within a single analysis. Very light elements, such as boron, lithium or beryllium, can be detected, along with a large series of other elements at concentrations of less then 1 ppm. The quantification at low concentrations is possible by LA-ICP-MS due to a matrix-independent calibration, including special computer analysis and specific software (6). The use of complementary solid-analysis methods (such as EMPA and XRF) for comparison and validation purposes (e.g. for quantitative measurement of silicon and aluminium) must be applied (see Table A5b).

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