Electron Microprobe Profile Analysis of Paraiba Tourmalines: Methods and Results
ELECTRON MICROPROBE ANALYSIS
The electron probe microanalysis (EMPA)was performed on a JEOL JXA 8200 instrument equipped with 5 wavelength dispersive x-ray spectrometers (WDS) and an energy dispersive spectrometer (EDS). All samples were coated with a 20 nm layer of carbon. The
Fig. Par28a-c Electron microprobe profile analysis across a zoned “Paraiba”-tourmaline perpendicular to thec-axis. (See Fig. Par29). Fig.Par28a-b is from the same run and corresponds to the LA-ICP-MS analyses of Fig.Par36a. Lowest MnO-concentrations and highest CuO-concentrations are found in the” neon”-blue colored partof the tourmaline crystal. Fig. Par28c is from a second measuring session with less measuring points and wasfocussed on the measurement of some additional elements such as Fluor (F), Chlorine (Cl) and Bismuth (Bi).Both methods, EMPA and LA-ICP-MS-analyses respectively, produced exactly the same distribution pattern ofthe trace elements in the tourmaline crystal (compare Fig. Par28b with Fig. Par36a). Note that the increase ofthe F-concentrations is correlated with the increase in Cu-concentrations in point 5 (Fig. Par28c). ForZn-concentrations See Fig. Par31h and Tab. Par03.