The Cu-Ga-Diagram for Origin Determination of Tourmalines Comparison of ED-XRF with LA-ICP-MS Analysis
Fig. Par82d Shows the linear regression of ED-XRF concentrations against LA-ICP-MS data from the same measuring spot. The ED-XRF needed to be corrected to lower values by a factor (0.6-0.7) due to the technical specifications and the calculation routine of the particular ED-XRF instrument. The LA-ICP-MS standard set was used to calibrate the ED-XRF data (See methods and calibration protocol in Box Par03). Similar regression slopes were found for different elements (slightly different for the element Mn).
The Cu-Ga-Diagram for Origin Determination of Tourmalines
